Text Box: • M.Bushnell, V.Agrawal, “Essentials of Electronic Testing”, KAP, 2000 . • M.Abramovici, M.Breuer, A.Friedman, “Digital Systems Testing and Testable Design”, IEEE Press, 1990 • K.Parker, “The Boundary-Scan Handbook. Analog and Digital”, KAP, 2003 . • A.Osseiran,”Analog and Mixed-Signal Boundary-Scan”, KAP, 1999 . • A.Crouch, “Design-for-Test For Digital ICs and Embedded Core Systems”, . Prentice Hall, 1999 • B.Nadeau-Dostie, “Design For At-Speed Test, Diagnosis and Measurement”,. KAP, 2000 . • Ami Gorodetsky, “Design-For-Testability and JTAG Technology”, . Students Workbook & Course Manual, 2005 (HUJI web site)